XPM - Accelerated Property Mapping

Organization: Hysitron Inc.
Year: 2016

XPM - Accelerated Property Mapping sets a new industry standard in terms of nanomechanical testing throughput paired with measurement resolution and accuracy. With XPM, more data can be taken in a single afternoon than could be collected in an entire year using traditional nanoindentation methodologies. These exclusive performance capabilities are made possible by the coupling and optimization of three industry-leading Hysitron technologies: a high bandwidth electrostatically actuated transducer, fast control and data acquisition electronics, and top-down in-situ SPM imaging. These synchronized technologies have the ability to perform six nanoindentation measurements/second to rapidly achieve comprehensive quantitative nanomechanical property maps, greatly increase measurement confidence through robust property distribution statistics, accelerate mandatory system calibrations, and enable reliable nanomechanical testing at elevated temperatures.

Time Is Running Out!